Scanning Probe Microscope (Atomic Force Microscope)
Product Manager (Scientific Instruments)
Teck Beng graduated from the National University of Singapore with a Master's Degree in Material Science. He has been providing application support for OES, XRF, XRD, EPMA, SPM, and ESCA for the past 20 years. He has conducted numerous Application Seminars and Workshops on Materials Characterization/Failure Analysis/Restriction of Hazardous Substances in countries supported by Shimadzu Asia Pacific.
